High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)
- Author(s)
- Natalia M. Martin, Jan Knudsen, Sara Blomberg, Johan Gustafson, Jesper N. Andersen, Edvin Lundgren, Harelind H. Ingelsten, Peder A. Carlsson, Magnus Skoglundh, Andreas Stierle, Georg Kresse
- Abstract
We have studied the ultrathin aluminum oxide film on NiAl(110) by a combination of high-resolution core-level spectroscopy and density functional theory calculations. Energy-dependent core-level data from the O 1s and Al 2p levels allows for a distinction between oxygen and aluminum atoms residing at the surface or inside the aluminum oxide film. A comparison to calculated core-level binding energies from the recent model by Kresse et al. [Science 308, 1440 (2005)] reveals good agreement with experiment, and the complex spectroscopic signature of the thin Al oxide on NiAl(110) can be explained. Our assignment of a shifted component in the O 1s spectra to oxygen atoms at the surface with a particular Al and oxygen coordination may have implications for the interpretation of photoelectron-diffraction experiments from similar ultrathin aluminum oxide films.
- Organisation(s)
- Computational Materials Physics
- External organisation(s)
- Lund University, Chalmers University of Technology, Max-Planck-Institut für Metallforschung
- Journal
- Physical Review B
- Volume
- 83
- No. of pages
- 5
- ISSN
- 1098-0121
- DOI
- https://doi.org/10.1103/PhysRevB.83.125417
- Publication date
- 2011
- Peer reviewed
- Yes
- Austrian Fields of Science 2012
- 103018 Materials physics
- Portal url
- https://ucris.univie.ac.at/portal/en/publications/highresolution-corelevel-spectroscopy-study-of-the-ultrathin-aluminum-oxide-film-on-nial110(a5d61fe6-9a46-4a4d-a4d1-a56a6843c240).html